ADVANCED ANALYSIS / TEST

IC Image Extraction

    IC Image Extraction

    • Extract images by layer for System IC products using Scanning Electron Microscope & Optical Microscope.
    • De-process : 14 ~ 28nm
    • Metal material : Al, Au and Cu
    • Analyzed Chips : BCD, SOI, GaAs and SiGe

    Photograph of materials

    • Optical Microscope Image
    • Scanning Electron Microscope Image