ADVANCED ANALYSIS / TEST

ELFR

    ELFR (Early Life Failure Rate)

    • Acceleration stress conditions provide thermal and electrical acceleration conditions during operation, causing initial failure
    • The purpose of evaluating thermal and electrical problems during operation, generally process or design problems, should be found, and the product should be operated to predict failure-in-time (FIT) and mean time to failure (MTTF) in the market using acceleration factors (temperature and voltage) to estimate the life of the product.

    Conditions of progress

    Early Failure Rate Duration / Temperature
    JEDEC(Industrial) AEC-Q100(Automotive)
    48 Hrs ≤ t ≤ 168hrs , 125℃ ≤ Tj , Vcc Max Grade 0: 48 hours at 150 °C or 24 hours at 175 °C , Vcc Max
    Grade 1: 48 hours at 125 °C or 24 hours at 150 °C , Vcc Max
    Grade 2: 48 hours at 105 °C or 24 hours at 125 °C , Vcc Max
    Grade 3: 48 hours at 85 °C or 24 hours at 105 °C , Vcc Max
    Grade 4: 48 hours at 70 °C or 24 hours at 90 °C , Vcc Max

    Bathtub curve

    • ▶ Initial defector: Section where fixing or potential defects occur due to various processes and environmental instability during semiconductor manufacturing
    • Accelerated stress conditions provide thermal and electrical acceleration conditions during operation, causing initial defects, which can occur in the ELFR section in an early stage, eliminating potential defects. Screen by applying stress to detect future defects in the current state