ADVANCED ANALYSIS / TEST

SEM

    SEM

    • A scanning electron microscope is a device that scans primary electrons of short wavelengths in a vacuum state and makes imaging observations using Signal on the sample surface.
    • Signal type - allows you to observe fine parts of the device you want to observe, such as secondary electrons (SE), reflective electrons, transmission electrons, backscatter electrons, and X-rays, using high resolution, and analyze the components of the observation device.
    • Analysis of sample shape, microstructure, and components using X-rays is possible

    Apply Analysis

    • Surface Analysis
      PKG, Wafer , PCB
    • Component analysis
      EDS Analysis (Inorganic Components)

    Equipment Specifications

    Analytical equipment details
    Manufacturer/Model Name : SUPRA 60 / Carl Zeiss
    1. Resolution : 1.0nm @ 15 kV,1.7nm @ 1kV,4.0nm
    2. Magnification : 12 - 900,000x
    3. Acceleration Voltage : 0.1 - 39 kV
    4. Probe Current : 4 pA - 10 nA (20 nA optional)
    5. Chamber : 520 mm (∅) x 300 mm(h)
    6. 6-Axes Motorised Super-Eucentric Specimen stage
    7. Image Processing : Resolution : Up to 3072 x 2304 pixel
    8. EDS (Energy Dispersive X-ray Spectromenter)

    Analysis Examples

    • Sectional structure
    • Whisker
    • Micro defect detection
    • Process