ADVANCED ANALYSIS / TEST

S.A.T

    SAT

    • Inject ultrasonic waves of 0-260Mhz. It is a non-destructive analysis device that can check the location and shape of peeling and cracking phenomena in semiconductors using the properties of ultrasonic waves.
    • The scanned ultrasound travels inside the element, and when a singularity exists in the path, the singularity detects reflected or untransmitted ultrasound and displays a signal on the screen.
    • At this time, you can check the location and size of the signal to see if there is a defect or not.

    Apply Analysis

    • Non-destructive analysis - Delamination, Crack, Void, Warpage, etc

    Equipment Specifications

    Analytical equipment details
    Manufacturer/Model Name : OKOS/ VUE 400-P
    1. Motor : Quad Linear Servo
    2. Sacn Speed : 1500mm/s
    3. Accuracy & Repeatability : +/- 0.5 Micron
    4. Scan Length : 400 mm
    5. Step Length : 380mm
    6. Focus Length : 35 mm
    7. C-Scan Area : 360mm x 350mm
    8. T-Scan Area : 360mm x 220mm

    Analysis Examples

    • [C-Scan] Reflected wave
    • [T-Scan] Transmission wave
    • Crack
    • [Delamination]
    • [Delamination]