ADVANCED ANALYSIS / TEST

CDM

    CDM (Charged Device Model)

    • This test is considered to be the most closely related mechanism to field defects. Use the method of charging and discharging the charge in the package, and the CDM classification level is from 200V to 1000V.
    • ESD is one of the main causes of defects in semiconductor products, and it is a phenomenon in which electric charges move instantaneously as two objects with different potentials come into contact. The human body gains or loses electric charges in a number of ways, which are commonly known as friction electricity, and then becomes positive or negative. The various situations in which semiconductor devices experience actual ESD phenomena have been modeled, and the ESD resistance of the product is classified into several grades according to each test level.

    Conditions of progress

    Stress Ref. Abbv. Conditions
    Charged Device Model ESD JESD22-C101 ESD-CDM TA = 25 °C
    Test name Reference Test requirements/cautions
    ESD - Charged Device Model AEC Q100-011 AEC Q100-011 Table 1: Integrated Circuit CDM ESD Classification Levels Reference