ADVANCED ANALYSIS / TEST

High Speed HTOL

High speed HTOL (High Speed (Production) HTOL Test/Assessment)

  • A high-speed frequency operation test is required for parts that cannot be operated in the existing HTOL test (10Mhz) due to an increase in the semiconductor operation frequency
  • If the signal is not transmitted correctly in the digital system, malfunction or normal operation cannot be performed
  • Verification of semiconductor initial design, strengthening semiconductor shipment quality competitiveness, and reducing quality costs in the future through high-speed (production) testing/evaluation

Equipment Specifications

HSB5000 Equipment Specifications
temperature socket 80
temperature system 1target = 1temperature control
temperature system ambient to 150° C
burn-in board 4
power/pattern zone 1
temperature uniformity ±2℃
memory depth 15Mbit
HSB5000 Equipment power specification
V1 0 ∼ +30 V 20A board Based on Chapter 4
V2 0 ∼ +30 V 20A
V3 0 ∼ +30 V 20A
V4 0 ∼ +30 V 20A
V5 0 ∼ +30 V 20A
V6 0 ∼ +30 V 20A
V7 0 ∼ +30 V 20A
V8 0 ∼ +30 V 20A
HSB5000 Equipment vector specification
4 Slot / Equipment ch number Operating Frequency Vil / Vih level
zone 0 slots 1,2,3,4 24CH differential signal 2Ghz~ 0.2 ~ 0.8 LVDS signal

Bathtub curve

  • ▶ ▶ Stabilizer: In a stable state where initial defects have been removed, defects occur constantly in the section where the user uses the product
  • The high speed test is conducted for the purpose of conducting the HTOL test in the User Operation Test environment.
    Limitations of accelerated life test equipment (Max. 10Mhz) is a self-developed high speed board system technology designed to test 3GHz class HTOL close to the actual operating environment.
    By conducting high-speed (operational) testing/assessment, the initial design verification of semiconductors, the quality competitiveness of semiconductors can be strengthened, and the quality cost of future production can be reduced.