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Test Analysis Division

TEST ANALYSIS DIVISION

HBM MM

ESD is one of the major defect in semiconductor products, it's phenomenon that electric charge temporarily moves when objects of different potentials come into contact. The human body gains or loses charge in various ways, It becomes a positive or negative state through the commonly known triboelectricity. This Semiconductor devices have been designed to simulate many situations that are affected by real ESD events, classify the ESD tolerance of the product into several classes depend on test level.

Human Body Model(HBM)

A test assumes that two objects with lost or gain charge are "semiconductor" and "human", Construct a circuit simulating the human body and apply an ESD pulse to the semiconductor. The HBM classification level is 250V to 8000V.

Machine Model(MM)

This test simulates the ESD situation that occurs while rubbing against equipment or other metal, charging the charge, and then contacting the object again during semiconductor manufacturing process. The MM classification level is 50V to 400V.

Reference Documents

Stress Ref. Abbv. Conditions
Human Body Model ESD JS-001 ESD-HBM TA = 25 °C
Charged Device Model ESD JESD22-C101 ESD-CDM TA = 25 °C
Machine Model JESD22-A115B ESD-MM TA = 25 °C

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