TEST ANALYSIS DIVISION
ESD is one of the major defect in semiconductor products, it's phenomenon that electric charge temporarily moves when objects of different potentials come into contact. The human body gains or loses charge in various ways, It becomes a positive or negative state through the commonly known triboelectricity. This Semiconductor devices have been designed to simulate many situations that are affected by real ESD events, classify the ESD tolerance of the product into several classes depend on test level.
Human Body Model(HBM)
A test assumes that two objects with lost or gain charge are "semiconductor" and "human", Construct a circuit simulating the human body and apply an ESD pulse to the semiconductor. The HBM classification level is 250V to 8000V.
This test simulates the ESD situation that occurs while rubbing against equipment or other metal, charging the charge, and then contacting the object again during semiconductor manufacturing process. The MM classification level is 50V to 400V.
|Human Body Model ESD||JS-001||ESD-HBM||TA = 25 °C|
|Charged Device Model ESD||JESD22-C101||ESD-CDM||TA = 25 °C|
|Machine Model||JESD22-A115B||ESD-MM||TA = 25 °C|